Short Courses I have Taught

I am just beginning to add links to syllabi for short courses I have taught on use of statistics in the semiconductor industry.

A half-day introduction to JMP

Basic introduction to features of JMP, including creation and editing of data sets, simple graphical methods and summary statistics

A one week course on SPC for Engineers and Technicians

This course delivers substance on how to manage and improve a process using statistical control charts and related methods.

A one week introduction to Design of Experiments (with a one week sequel)

This course discusses use of Design of Experiments as part of a strategies for process improvement or new process development. We pay particular attention to split lot experiments and fractional factorials.

A half day introduction to Managing Variation for Executives and Senior Managers

This course gives an executive overview on how statistical methods can be a powerful tool for improving profitability. Examples include both use of statistical methods in operations and research and development AND in the work of the executive.

A two week course in Design of Experiments

This in-depth course looks at simple comparative experiments to compare processes, or to compare a process with a standard/specification. It looks at split lot experiments for efficient process comparisons. Fractional factorial experiments are seen to provide a quick method for sorting through a large number of candidates to find the active factors, and then to determine appropriate settings of these factors.

A two and a half day course in Design of Experiments

This course is a short introduction to the Design of Experiments, covering basic ideas and equipping the participant with a sound understanding of comparative experiments and split lot experiments. It also gives an introduction to fractional factorials.

Response Surface Methods

This course builds on either the two week, the one week or the two and a half day course in Design of Experiments, and covers process optimization using Response Surface Methods.

Special topic courses can quickly be created on such topics as:

bulletProcess capability - use and abuse
bulletStudy and management of measurement processes
bulletSetting up new equipment
bulletHow to compare two processes
bulletAdvanced topics in Statistical Process Control

If you are interested in having one or more of these short courses offered to your organization, please contact me at the email or phone number given on the top-level home page (click here to get there!)..  Bill Parr